Figure 2 | Scientific Reports

Figure 2

From: Molecular coupling competing with defects within insulator of the magnetic tunnel junction-based molecular spintronics devices

Figure 2

Conceptual sketches showing cross-sectional sideview of (a) an MTJMSD with defect free insulator, (b) MTJ testbed with defect free insulator, (c) MTJ with hillocks, (d) MTJ with pin holes, (e) an MTJMSD with competing molecule and defects. (f) Testbed used for investigating defects in AlOx. TEM image of (g) as produced and (h) thermally stressed Ti/Co/AlOx. Representative AFM image analysis quantify (i) pinholes, and (j) hillocks. (l) Compositional analysis confirming hillocks are made up of cobalt (Co) and Ti. Inset image in (l) correspond the site of compositional analysis in the TEM study. (k) 3D AFM image showing sharp hillocks. Panel (a–e) were sketched in Adobe Illustrator CS6. (a–e) Sketches, TEM images in panel (g, h), and and atomic force microscope images (i), (j), and (k) were assembled in Adobe Illustrator CS6.

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