Figure 3 | Scientific Reports

Figure 3

From: Identification of type of threading dislocation causing reverse leakage in GaN p–n junctions after continuous forward current stress

Figure 3

(a)–(c) Forward and (d)–(f) reverse current density–voltage curves acquired during continuous current injection tests. The injected current density values have been normalized by the anode areas in (a)–(c), and anode diameters, Φanode, are provided at the top of each figure. The reverse leakage current density values in (d)–(f) have been normalized by the area of the p–n junction, and the junction diameters, Φpn, are provided at the base of each figure.

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