Figure 10
From: Thin films of the \(\alpha\)-quartz \(Si_xGe_{1-x}O_2\) solid solution
AFM images of (a) crystalline \(Si{0.48}Ge_{0.53}O_2\) on a \(SrTiO_3\) substrate. (b) the evaporation pits observed in the same sample, revealing the bare substrate.
