Figure 3
From: Thin films of the \(\alpha\)-quartz \(Si_xGe_{1-x}O_2\) solid solution
AFM images of \(Si_xGe_{1-x}O_2\) thin films thin films grown on Y-cut quartz substrates, with (a) x = 0, (b) x = 0.08, (c) x = 0.16, (d) x = 0.20, (e) x = 0.21 and (f) x = 0.48. Note the columnar features growing in number and height with increasing Si content. Scale bar is 600.0 nm for the first row and 2.0 μm for the second row.
