Figure 8

The relative half width of {hkil} diffraction peaks (i.e., FWHMs divided by its peak positions) analysed as a function of applied stress at (a) 298 K, (b) 123 K and (c) 15 K for RD and TD loading conditions.

The relative half width of {hkil} diffraction peaks (i.e., FWHMs divided by its peak positions) analysed as a function of applied stress at (a) 298 K, (b) 123 K and (c) 15 K for RD and TD loading conditions.