Figure 11
From: Polarization and angular insensitive bendable metamaterial absorber for UV to NIR range
Demonstration of (a–d) E-field of the proposed model for TE and TM mode in 772.82 nm (max point) and 1600 nm (min point) with scale bar (V/nm) in y-x axis cross sectional view, (e–h) H-field of the proposed model for TE and TM mode in 772.82 nm (max point) and 1600 nm (min point) with scale bar in A/m in y–x axis cross sectional view, and (i–l) surface current density of the proposed absorber for TE and TM mode in 772.82 nm (max point) and 1600 nm (min point) with scale bar (A/m) in y–x axis cross sectional view.
