Table 3 Comparison between the proposed Memristor design and the relevant Memristors presented in literature.

From: Memristor-based PUF for lightweight cryptographic randomness

Relevant TRNGs/PUFs designs in the literature

Performed NIST tests

Authors/references

Memristive read and write PUF

–N/A–

28

N-bit read and write Memristive PUF (M-PUF)

–N/A–

29

Hybrid memristor-CMOS PUF

–N/A–

30

Nanocrossbar memristor PUF

–N/A–

26

W/TiN/TiON/SiO2/Si memristor

–N/A–

31

Cu/AlOx and Ti/HfOx memristors

–N/A–

32

TaOx-based devices

All 15 NIST tests

33

(expensive quality bits generated)

 

Pt/Ag/Ag:SiO2/Pt memristor

All 15 NIST tests (complex device Structure)

34

(complex device Structure)

 

RRAM TRNGs

12 NIST tests

35

Cu/HfO\(_{2-x}/p^{++}\)Si Memristor

All 15 combined with the literature

MR-PUF TRNG proposed in this paper

three additional tests using efficient and low cost structure

 
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