Figure 1
From: Electron beam evaporation of superconductor-ferromagnet heterostructures
(a) XRD spectra of a thin film sample, with Nb (110) and Si substrate (400) peaks identified. Inset shows an XRR scan for the same sample. The solid red line is a fit to the data. (b) AFM image of the same Nb(30)/AlOx(3) thin film.
