Table 2 The analytical results of a driver IC process.
From: Product quality evaluation by confidence intervals of process yield index
Item | \(USL_{j}\) | \(LSL_{j}\) | \(\overline{\overline{X}}_{j}\) | \(\overline{s}_{j}\) | \(\hat{Q}_{puj}\) | \(LQ_{puj}\) | \(UQ_{puj}\) | \(\hat{C}_{plj}\) | \(LQ_{plj}\) | \(UQ_{plj}\) | \(LS_{pkj}\) | USpkj |
|---|---|---|---|---|---|---|---|---|---|---|---|---|
A* | 105 | 85 | 97.0 | 8.8 | 2.73 | 2.43 | 3.033 | 4.08 | 3.66 | 4.503 | 0.889 | 1.079 |
B | 70 | 40 | 52.7 | 12.4 | 4.17 | 3.741 | 4.602 | 3.06 | 2.73 | 3.39 | 0.981 | 1.191 |
C* | 75 | 65 | 69.1 | 4.4 | 4.02 | 3.606 | 4.44 | 2.79 | 2.484 | 3.096 | 0.905 | 1.098 |
D* | 35 | 25 | 29.4 | 4.8 | 3.51 | 3.141 | 3.882 | 2.76 | 2.457 | 3.063 | 0.886 | 1.084 |
E* | 300 | 200 | 253 | 51 | 2.76 | 2.457 | 3.063 | 3.12 | 2.787 | 3.456 | 0.863 | 1.067 |
F | 135 | 85 | 108 | 22 | 3.69 | 3.306 | 4.077 | 3.15 | 2.814 | 3.489 | 0.992 | 1.216 |
Lower confidence interval for the integrated product | \(LS_{pk}^{T}\) \(=\) 0.9626 | |||||||||||
Upper confidence interval for the integrated product | \(US_{pk}^{T}\) \(=\) 0.9977 | |||||||||||
