Figure 3
From: Quantum annealing with special drivers for circuit fault diagnostics
(1) and (2) show the success probability versus the minimum gap for 22 non-degenerate single fault instances of the C17, with 40 units and 80 units of time respectively, for the single parameter function (labeled param), the linear function (labeled linear) and a piece-wise linear function fitted over 100 evenly spaced points, such that the slope is proportional to the instantaneous inverse gap squared between evenly spaced \( s_{i-1} \) and \( s_{i} \) (labeled opt_adia).
