Table 5 Homogeneous subset analysis for image artifact intensity based on tube voltage groups.

From: Metal artifact reduction in ultra-high-resolution cone-beam CT imaging with a twin robotic X-ray system

Artifact intensity

Subset 1

Subset 2

Subset 3

Subset 4

Subset 5

Subset 6

Subset 7

Subset 8

Subset 9

Subset 10

MDCT 70 kVp

1.5

         

MDCT 80 kVp

2.4

2.4

        

MDCT 100 kVp

 

3.5

3.5

       

CBCT 60 kVp

 

4.1

4.1

4.1

      

MDCT 120 kVp

  

5.1

5.1

5.1

     

MDCT 140 kVp

   

6.0

6.0

6.0

    

MDCT Sn 100 kVp

    

6.9

6.9

6.9

   

MDCT Sn 150 kVp

     

7.5

7.5

   

CBCT 81 kVp

      

8.6

8.6

  

CBCT 102 kVp

       

9.8

9.8

 

CBCT 117 kVp

        

10.8

10.9

CBCT 133 kVp

         

11.7

Adjusted p value

.162

.066

.240

.287

.122

.360

.081

.094

.094

.052

  1. After differences between dependent nonparametric variables were ascertained with the Friedman test (p < .001), groups were compared pairwise with post-hoc tests and listed in order of ascending mean rank. The rank means that are listed under each subset are not significantly different from each other. In contrast, mean values that are not listed in the same subset differ significantly (adjusted p value for multiple comparisons < .050).
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