Figure 1
(a) XRD pattern of a 60 nm MnSi film on Si(100) by FLA. B20-MnSi and MnSi1.7 phases coexist. (b) XRD pattern of a 60 nm MnSi film on Si(111) by FLA, and in this sample B20-type MnSi is the single phase. The insert table in (b) shows the relative intensity ratio of different diffraction planes. Ref.23 shows the (210) and (211) planes should be the two strongest peaks. Sample G shows consistent with Ref.23, indicating a polycrystalline structure. The (111) plane of sample L is the strongest peak, meaning the (111)-textured of this sample.
