Figure 4

Using the same SLM calibration settings, shown are brightfield-mode multifocal images obtained using optimized patterns corresponding to (a) \(\lambda _\text {c}=512\) nm with \(M=0.91\), (b) \(\lambda _\text {c}=610\) nm with \(M=0.81\), (c) \(\lambda _\text {c}=685\) nm with \(M=0.79\), and (d) a multifocal image of a stationary 200 nm bead sample acquired at \(\lambda _\text {c}\) =671 nm emission wavelength with \(\Delta z\) = 900 nm indicating the PSF of the microscope with the beads in focus in the central subimage. The scale bar in each figure represents 20 \(\mu \hbox {m}\).