Figure 1
From: Effect of high-pressure D2 and H2 annealing on LFN properties in FD-SOI pTFET
TEM image of the cross-section of an FD-SOI TFET.
Figure 1 | Scientific Reports
From: Effect of high-pressure D2 and H2 annealing on LFN properties in FD-SOI pTFET
TEM image of the cross-section of an FD-SOI TFET.
