Figure 6
From: Thermal-stress-induced birefringence management of complex laser systems by means of polarimetry
The polarizer-rejected part of the beam with polarization state non-uniformly changed by thermal-stress-induced birefringence. The beam profiles shown are (a) calculated using Mueller matrix Fig. 3, (b) measured using CW alignment beam, (c) measured using the pulsed beam with no amplification.
