Figure 3

XRD patterns of SeMNPV and microencapsulated preparations. Freeze-dried samples were ground and pressed into 1 mm thick circular slices, which were tested by XRD. The test parameters were set as follows: copper target, input = 1.5418 A, 40 kV pipe pressure, 40 mA pipe current, diffraction angle from 2θ to 80°, scanning rate 2°/min. the SeMNPV has a sharp diffraction peak and a flat baseline, which is expressed as a crystalline state. The diffraction curve of the polysaccharide contained only a few small, and no sharp, peaks. No obvious diffraction peak for the PDA was observed.