Figure 3

TEM and EDS for S1. (a) Cross-sectional TEM and HRTEM images of specimen S1, show the sequence of layers on the MgO substrate. (b) FFT patterns of the area marked by the squares in (a) containing MgO, Mn\(_{3}\)Ir, CoFe, and TaN. (c) EDS spectrum and (d) EDS maps of the elements C, Mg, O, Mn, Ir, Co, Fe, Ta, and N in the layer stack show sharp interfaces along with the HAADF STEM image of the interfaces. The presence of C at the top layer is from the capping layer used during sample preparation for FIB processing.