Figure 2

(a) Evolution of TMR in Nb-pMTJs with different top CoFeB layer thicknesses after annealing under several different conditions. The samples were successively annealed at 260 °C for 3 min, 300 °C for 10 min, 350 °C for 10 min, and 400 °C for 10 min. (b–d) TMR hysteresis curves with (b) 0.94 nm, (c) 1.14 nm, (d) 1.35 nm top CoFeB thickness after the 300 °C annealing for 10 min. (e–g) TMR curves under different annealing conditions with similar top CoFeB thicknesses (around 1.14 nm).