Table 2 Under SELF, the run length profile utilizing P and PP distribution for Bayesian-AEWMA CC for \(\psi\) = 0.25, n = 5.

From: Adaptive EWMA control chart using Bayesian approach under ranked set sampling schemes with application to Hard Bake process

Shift

Bayes-EWMA

SRS

Bayes-AEWMA

SRS

Bayes-AEWMA

RSS

Bayes-AEWMA

MRSS

Bayes-AEWMA

ERSS

ARL

SDRL

ARL

SDRL

ARL

SDRL

ARL

SDRL

ARL

SDRL

L = 2.8987

h = 0.241

h = 0.0546

h = 0.03865

h = 0.0758

0.00

369.49

364.82

369.00

367.39

370.42

428.73

369.06

425.35

371.88

411.70

0.20

178.20

175.14

97.04

80.91

47.08

42.97

33.94

28.30

46.16

42.90

0.30

104.70

100.95

55.71

42.80

23.94

21.86

18.62

15.89

30.39

27.90

0.40

63.11

58.20

36.15

25.09

14.00

13.44

11.37

10.55

17.32

15.91

0.50

41.21

36.61

25.95

17.04

8.66

8.32

7.22

7.15

10.95

9.66

0.60

28.45

24.57

19.80

12.20

5.90

5.42

4.92

4.88

7.62

6.43

0.70

20.61

16.37

15.41

9.09

4.42

3.69

3.50

3.28

5.69

4.37

0.75

17.97

13.87

14.11

8.17

3.87

3.04

3.07

2.72

5.01

3.71

0.80

15.71

11.75

12.87

7.26

3.46

2.60

2.64

2.16

4.41

2.96

0.90

12.51

8.86

10.76

5.97

2.86

1.90

2.19

1.60

3.69

2.29

1.00

10.22

6.77

9.17

4.96

2.43

1.45

1.88

1.20

3.19

1.72

1.50

5.15

2.51

4.90

2.77

1.54

0.64

1.20

0.44

2.01

0.73

2.00

3.46

1.33

2.98

1.83

1.18

0.39

1.03

0.18

1.53

0.55

2.50

2.66

0.86

1.98

1.15

1.04

0.20

1

0

1.22

0.42

3.00

2.19

0.61

1.48

0.72

1

0

1

0

1

0

4.00

1.66

0.50

1

0

1

0

1

0

1

0

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