Figure 6
From: A simple and efficient process for the synthesis of 2D carbon nitrides and related materials
TEM analyses on CN-washed material. (a) TEM image in bright-field mode at low magnification showing large flake, (b) TEM image in bright-field mode at high magnification showing homogeneous, thin and layered flake, (c) TEM image of isolated uranyl ions loaded flake observed at 120 kV showing Moiré pattern, (d) HAADF-STEM image of CN flakes deposited on holey carbon grid showing thin flakes with folds (yellow circle), (e) STEM-EDS mapping mode of nitrogen (K\(\alpha \) line) in red, (f) EELS spectrum.
