Figure 9
From: A simple and efficient process for the synthesis of 2D carbon nitrides and related materials
TEM analyses of C\(_2\)N. (a) TEM image at low magnification showing large, thin and homogeneous flakes. (b) HRTEM on a flake showing atomic rows (distance = 0.5 nm) and FFT of the image in inset. (c) Two stacked C\(_2\)N layers (one layer in red and the other in blue, only nitrogen atoms shown for clarity, unit cells of the two stacked layers shown as rhombus) exhibiting the observed 0.5 nm distance. (d) EELS analysis of a single flake suspended on holey carbon grid*: (e) carbon grid analysis (green circle on the image (d)), (f,g) C\(_2\)N sample (red circle on the image (d)). *The regular, circular holes observed on the sample are due to the electron-beam-induced damages.
