Figure 4
Illustration of the non-local four-probe method for determining the temperature dependence of the upper critical magnetic film Hc2, a non-local resistance-vs-temperature characteristics of a 10-nm thick NbN film measured for two configurations A and B shown in Figs. 1 and 2 in a perpendicular magnetic field μ0H = 0.5 T, b restored Ri(T) traces for four different sections of the sample (solid, dashed, dotted and dashed-dotted curves correspond to i = 1, 2, 3, 4, respectively), the crosses indicate positions of middle points in the transition curves, Ri(Tc,i) = R*, cf. “Methods” section, c comparison of the Hc2-vs-t curves for parallel \((\theta = 90^{ \circ } )\) and perpendicular \((\theta = 0^{ \circ } )\) magnetic fields found by using the four R(T) traces (symbols) and the averaged over them curve (lines).
