Figure 4
The outline of EBSD data statistical analysis for XY-plane image from Fig. 3. (a) The central panel plot demonstrates the thresholding of the grain size data in terms of ECD on Columnar Core and other microstructures. (b) The top panel is used for estimation of Columnar Core \({{\varvec{f}}}_{{\varvec{V}}}\) based on running sum of grain area fractions. (c) The right panel plot illustrates the lognormal fit of thresholded ECD distribution for evaluation of \({\varvec{\mu}}\) and \({\varvec{\sigma}}\) parameters in \({{\varvec{P}}{\varvec{D}}{\varvec{F}}}_{{\varvec{L}}-{\varvec{N}}}\). (d) The insert in central panel plot is used to estimate the \({\varvec{b}}/{\varvec{a}}\) parameter ratio for thresholded ECD distribution. See text for more details.
