Figure 1
From: Strip-loaded Mach–Zehnder interferometer for absolute refractive index sensing
Strip-loaded Mach–Zehnder interferometer configuration. (a) Cross section geometry of the strip-loaded waveguide showing the region of mode propagation confinement. The substrate is an oxidized silicon wafer. The guiding layer is TiO\(_2\) thin film with thickness of 200 nm. The strip atop is AZ-2070 - nLOF polymer. The dimensions of the polymer strip are 1200 nm wide and 800 nm high. (b). A 3D drawing of the strip-loaded Mach–Zehnder interferometer. Both the reference and sample arm are made of the same nLOF polymer. A large opening is performed in the sample arm to let the analyte in contact with the titania film. The reference arm is not influenced by the refractive index surrounding the MZI.
