Figure 1
From: Simulation of a randomly percolated CNT network for an improved analog physical unclonable function
(a) AFM images of the CNT network according to deposition time. (b) IDS-VGS curves of the CNT network transistors. The s-CNT ratio is 90%, and the CNT deposition times are 1, 3, and 14 min, showing differences in electrical properties and process deviation depending on the process conditions. (c) Deviation of log(Ioff) according to deposition time. Ioff is the IDS value at VGS = 0 V.
