Figure 4 | Scientific Reports

Figure 4

From: De-embedding method for a sensing area characterization of planar microstrip sensors without evaluating error networks

Figure 4

Simulated S-parameters (‘Sim.’ with solid lines), measured S-parameters after the TRL calibration technique (‘Meas. (TRL)’ with dashed lines), and extracted S-parameters by the proposed method for \(L_{nr} = 9.4\) mm (‘Ext. (PM) Without RA’ by dashdot lines for the result without RA and ‘Ext. (PM) With RA’ by dotted lines for the result with RA) of the constructed bianisotropic MM slab. (a) Real and (b) imaginary parts of \(S_{11}^D\), (c) real and (d) imaginary parts of \(S_{21}^D\) (\(\cong S_{12}^D\)), and (e) real and (f) imaginary parts of \(S_{22}^D\).

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