Table 2 Cryo-EM used for Fab studies.
Sample name | Fab | ||
|---|---|---|---|
EM equipment | JEM-2200FS | Titan Krios | |
Phase Plate engaged | Yes | Yes | No |
Voltage (kV) | 200 | 300 | |
Detector | DE-20 | K3 | |
Magnification | 40,000× | 105,000× | |
Pixel size (Å/pixel) (Imaging) | 1.4 | 0.415 | |
Pixel size (Å/pixel) (Processing) | 1.4 | 0.83 | |
Electron exposure (e–/Å2) | 42 | 50.56 | |
Exposure time (s) | 3 | 1.62 | |
Frames (no.) | 75 | 50 | |
Defocus range (μm) | − 0.0 to − 0.5 | − 0.5 to − 0.8 | − 1.6 to − 3.3 |
Micrographs stacks (no.) | 55 | 956 | 10,166 |
Picking particle images (no.) | 44,967 | 288,931 | 12,650,536 |
Final particle images (no.) | 7080 | 72,035 | 305,246 |
