Table 1 Overview of the average root-mean-squared profile roughness (RMS-RQ) values based on the SEM images of tilted particles (values bolded) and based on the AFM-in-SEM images (values not bolded). SEM-based uncertainties are determined from repeated measurements and corresponding image analysis conducted twice. AFM-in-SEM-based average roughness values and uncertainties are calculated from five different subsections (1.4 µm × 1.4 µm) per image (px = individual particle index).

From: Towards 3D determination of the surface roughness of core–shell microparticles as a routine quality control procedure by scanning electron microscopy

Particle number

RMS-RQ (nm)

PS

PS/Fe3O4

PS/Fe3O4/SiO2 (batch 1)

PS/Fe3O4/SiO2 (batch 2)

p1

3.8 ± 1.6

11.2 ± 1.5

19.5 ± 1.4

24.2 ± 0.9

p2

4.1 ± 1.3

11.5 ± 1.5

20.0 ± 1.0

24.0 ± 1.7

p3

4.8 ± 1.0

14.7 ± 2.0

20.8 ± 0.7

35.2 ± 2.3

p4

4.9 ± 0.5

8.6 ± 0.7

20.2 ± 2.7

37.6 ± 1.4

p5

4.2 ± 0.4

10.7 ± 0.5

36.6 ± 0.7

39.1 ± 1.6

p6

4.1 ± 0.4

13.9 ± 0.4

33.8 ± 3.4

28.8 ± 4.9

p7

–

14.7 ± 0.7

18.8 ± 2.6

32.3 ± 5.5

p8

–

–

22.2 ± 3.2

48.6 ± 8.3

p9

–

–

23.7 ± 4.0

12.6 ± 2.1

p10

–

–

15.4 ± 3.8

35.5 ± 6.0

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