Fig. 8
From: Depth-resolved characterization of Meissner screening breakdown in surface treated niobium

Implantation distributions \(\rho (x)\) vs. stopping depth x from SRIM Monte Carlo code46 simulation, represented as coloured histograms (with 60 bins), for various \(^{8}\text{Li}^{+}\) energies. Solid lines are fits to a phenomenological implantation distribution function (for details, see47). The grey area indicates the commonly present \({{\text{Nb}}_{2}{\text{O}}_{5}}\) native-oxide layer with typical thickness of \(\sim\) 5 nm.