Fig. 7
Measured (solid lines) versus modelled (dashed lines) reflectance of the stack with constant index Pt layer and graded index Pt layer. Reflectance at 45° angle of incidence (a–b) has been measured using spectral ellipsometry. Reflectance at normal incidence (c) has been measured using Ulbricht sphere. The reflectance data in (b–c) are normalized with respect to reflectance of the NiCr sample. Dashed lines represent the modelled reflectance using SE software and the optical constants shown in Fig. 6 (d–e) The scheme (d) and the photograph (e) of the equipment used to record total reflectance (specular and diffuse reflectance) using an integrating sphere setup.
