Fig. 4

(a) TEM micrograph alongside the fast Fourier transformation (FFT) diffractogram corresponding to the various regions in the shear band and matrix. The FFT diffractogram reveals two sets of diffraction spots corresponding to the nano twins within the SBs, (b) TEM micrographs of the lattice fringes within the shear band reveal local grain refinement, as evidenced by the multi-spot FFT diffractogram.