Table 3 Parameters of system suitability testing of the developed thin layer densitometric method.
Parameters | DIP | ERG | CAF | PHEN | MEP | Reference46 | ||||
|---|---|---|---|---|---|---|---|---|---|---|
Retardation factor (Rf) | 0.06 | 0.36 | 0.50 | 0.86 | 0.55 | – | ||||
Resolution (Rs) | 5.00 | 2.20 | 5.50 | – | R > 1.5 | |||||
Retention factor (k) | 15.67 | 1.78 | 1.00 | 0.16 | 0.82 | – | ||||
Selectivity (α) | 8.80 | 1.78 | 6.25 | – | α > 1 | |||||
Symmetry factor | 1.03 | 1.00 | 1.02 | 1.00 | 1.05 | < 1.5 | ||||
