Table 1 Bulk Ga-concentrations for two sets of APT-specimens prepared at 25, -30 and -60 °C shown in Fig. 3b (set 1) and Supplementary Fig. 6 (set 2).

From: Effective preparation of low-melting solder materials for atom probe tomography

Bulk Ga-concentration/[at.%]

   

Set

25 °C

−30 °C

−60 °C

1

0.098

0.089

0.016

2

0.091

0.079

0.039

Mean

0.095

0.084

0.028

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