Fig. 5 | Scientific Reports

Fig. 5

From: Investigating the link between a layer thickness and surface relief depth in an azo poly(ether imide)

Fig. 5

Photographs of the diffraction patterns observed on the screen behind the (a) PI-Az-2, (b) PI-Az-3, (c) PI-Az-4 sample, when the 690 nm probe beam was incident at the central locations of the inscribed SRGs. The vertical dashed line indicates the 0th-order diffraction spots. Slight disproportions in the spot sizes and their mutual separation seen between the right and left part of the photos result from a side position of the camera.

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