Fig. 5
Contour mapping of PCE with respect to varying absorber defect density (Nt) and acceptor density (NA) for a CdS, b Nb2O5, c ZnSe, and d MZO ETL configured devices.
Fig. 5 | Scientific Reports
Contour mapping of PCE with respect to varying absorber defect density (Nt) and acceptor density (NA) for a CdS, b Nb2O5, c ZnSe, and d MZO ETL configured devices.
