Fig. 10 | Scientific Reports

Fig. 10

From: Impact of interface roughness correlation on resonant tunnelling diode variation

Fig. 10

A composite figure visualising the IV characteristics of 25 RTDs generated with an IR of correlation length \(L_C=2.5\,\text{nm}\). (a) depicts all the IV characteristics (grey dashed lines), with an average (red dotted line with dot markers) and a ‘smooth’ RTD (solid black line with plus markers) for comparison. (b) is a scatterplot of the resonant peak IV values taken from (a), and is bifurcated with dashed lines at the mean values of the resonant peak values, \(V_r=0.2736\,\text{V}\) and \(I_r=0.1918\) μA. (c) and (d) are accompanying histograms and fitted normal distributions for the resonant peak voltage \(V_r\) and current \(I_r\) distributions respectively.

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