Fig. 11
From: Impact of interface roughness correlation on resonant tunnelling diode variation

A composite figure visualising the IV characteristics of 25 RTDs generated with an ‘improved’ isotropic IR of correlation lengths \(L^{Y}_{C}=L^{Z}_{C}=2.5\,\text{nm}\). (a) depicts all the IV characteristics (grey dashed lines), with an average (red dotted line with dot markers) and a ‘smooth’ RTD (solid black line with plus markers) for comparison. (b) is a scatterplot of the resonant peak IV values taken from (a), and is bifurcated with dashed lines at the mean values of the resonant peak values, \(V_r=0.2680\,\text{V}\) and \(I_r=0.2270\) μA. (c) and (d) are accompanying histograms and fitted normal distributions for the resonant peak voltage \(V_r\) and current \(I_r\) distributions respectively.