Fig. 5
From: Impact of interface roughness correlation on resonant tunnelling diode variation
Average ACF for \(\text {GaAs/Al}_{0.3}\text {Ga}_{0.7}\text {As}\) interfaces of 25 RTD devices generated in an ‘improved’ IR of isotropic correlation lengths \(L^{Y}_{C}=L^{Z}_{C}=2.5\) nm, plotted as solid blue and yellow lines for the Y and Z directions respectively. The exponential ACF30 fits are given as dashed lines with the corresponding colours.
