Fig. 8 | Scientific Reports

Fig. 8

From: Impact of interface roughness correlation on resonant tunnelling diode variation

Fig. 8

IV characteristic for the baseline RTD shown in Fig. 1. The resonant peak, or local maxima in current \(I_r=0.2661\) μA at bias \(V_r=0.24\,\text{V}\), and the valley, or local minima \(I_v=0.0793\) μA at \(V_v=0.25\,\text{V}\), are two key points for this nonlinear IV characteristic. These bound the NDR, and define the figure of merit PVCR (Peak-to-Valley Current Ratio) \(I_r/I_v\). Figure 9a and b are measured for the resonant peak in this figure, and Fig. 9c and d are measured for the valley.

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