Table 2 Standard deviations of \(V_r\) and \(I_r\) for the previous and ‘improved’ IR for different correlation lengths.
From: Impact of interface roughness correlation on resonant tunnelling diode variation
\(L_C\) (nm) | IR | Improved IR | ||
|---|---|---|---|---|
\(\sigma _{V_{r}}\) (mV) | \(\sigma _{I_{r}}\) (nA) | \(\sigma _{V_{r}}\) (mV) | \(\sigma _{I_{r}}\) (nA) | |
2.5 | 6.2 | 9.0 | 24.2 | 34.7 |
5.0 | 6.9 | 10.2 | 28.7 | 47.6 |
7.5 | 11.4 | 17.2 | 35.9 | 68.8 |
10.0 | 11.7 | 18.8 | 38.8 | 80.9 |
