Fig. 2
From: X-ray near-field multi-slice ptychography for in-situ imaging
Near-field multi-slice ptychography of ex-situ cuprous oxide nanoparticles deposited on both sides of a polyimide foil. (a) schematic of the sample placed 2840 µm downstream of the focus of the X-ray beam with the two particle layers separated by a 225 µm-thick polyimide foil. (b) shows the corresponding reconstructed illumination with a size of 8.5 µm \(\times\) 10 µm. (c) reconstruction of the scan assuming a single optically thin object. (d) summed phase of the multi-slice reconstruction shown in (e) first slice (upstream) and (f) second slice (downstream). The particles on the downstream side of the foil (slice 2) appear blurred in the single slice reconstruction (see e. g. the blue arrow), while they are well resolved in the reconstruction of the second slice and in the sum of the slices.
