Figure 1

(a) RHEED oscillations recorded during PLD of 10 nm LSMO and subsequent 20 nm STO thin film layers. (b) RHEED patterns taken before deposition on the bare STO single crystal, after LSMO growth, and after STO growth (from left to right). (c) AFM scans of the bare STO single crystal, after LSMO growth, and after STO growth (from left to right, white bars scale with \(1~\upmu\)m). (d) XRD around the (002) peak of the sample after LSMO growth (top) and after STO/LSMO growth (bottom, shown spectra are offset along the y-axis for clarity). The LSMO (002) peak is marked by the red star.