Figure 4

(a) RHEED oscillations recorded during PLD of 5 uc LAO on 20 nm thick, terminated and annealed STO layer transferred to an \(\hbox {Al}_2\) \(\hbox {O}_3\) host substrate. (b) RHEED pattern before (top) and after LAO growth (bottom). (c) AFM scans of the sample after LAO growth (white bar scales with \(1~\upmu\)m). (d) XRD around the (002) peak after LAO deposition. (e) XRR after LAO deposition experimental (top) and simulated (bottom).