Fig. 1 | Scientific Reports

Fig. 1

From: Dielectric function and thermo-optic coefficients of silicon-doped GaN substrates at elevated temperature from 298 K to 873 K in the UV-Vis-NIR spectrum

Fig. 1

Pseudo dielectric function \(\varepsilon _{pseudo}\) of Si doped GaN substrate measured by the spectroscopic ellipsometer at 298 K. The left arrow and right arrow point the real part and imaginary part of the pseudo dielectric function, respectively. The inset shows the zoomed-in view at the wavelength range from 250 nm to 450 nm.

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