Fig. 3
From: Controlling Mie scattering response to refractive index variations via light field manipulation
(a) Schematic diagram of the tightly focused system. (b–e) Amplitude and phase distributions of the x and y components of the paraxial beam corresponding to the PMs. (f–i) Amplitude and phase distributions of the x and y components of the paraxial beam corresponding to the anti-PMs. \(\:h=fsin{\theta\:}_{max}\)is the radius of the entrance pupil of the high-NA optical system26.
