Fig. 2
From: Deep learning of structural morphology imaged by scanning X-ray diffraction microscopy
NanobeamNN predictions on simulated and experimental data. (a) Top row: simulated diffraction patterns directly input to NanobeamNN. Bottom row: simulated diffraction generated from the values of strain \(\upepsilon\) and tilts \(\upomega\) and \(\upchi\), predicted by NanobeamNN from the images in the top row. (b) Top row: experimentally measured diffraction patterns of the pseudo-cubic (pc) 002pc peak of an SrIrO3 thin film. Bottom row: simulated diffraction generated from predicted \(\upepsilon\), \(\upomega\), and \(\upchi\), from the images in the top row.
