Fig. 4
From: Deep learning of structural morphology imaged by scanning X-ray diffraction microscopy
Comparison of conventional fitting and NanobeamNN on experimental data. (a) Diffraction contrast features of the SrIrO3 002pc peak measured by scanning X-ray nanoprobe diffraction microscopy as analyzed by conventional fitting of the correlation between measured and simulated diffraction. (b) NanobeamNN evaluations of the experimental data shown in (a).
