Fig. 14

JSC (short circuit current density) plot at 100–1000 nm thickness variation of CsPb0.75Sn0.25IBr2 (top cell absorber) and Cs2TiI6 (bottom cell absorber), illustrating the evaluation of the current matching point.

JSC (short circuit current density) plot at 100–1000 nm thickness variation of CsPb0.75Sn0.25IBr2 (top cell absorber) and Cs2TiI6 (bottom cell absorber), illustrating the evaluation of the current matching point.