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Efficient industrial point cloud anomaly detection via spatial context aggregation and selective anomalous feature generation
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  • Published: 24 February 2026

Efficient industrial point cloud anomaly detection via spatial context aggregation and selective anomalous feature generation

  • Dinh-Cuong Hoang1,
  • Phan Xuan Tan2,
  • Anh-Nhat Nguyen3,
  • Minhhuy Le4,
  • Ta Huu Anh Duong1,
  • Tuan-Minh Huynh1,
  • Duc-Manh Nguyen1,
  • Minh-Duc Cao1,
  • Duc-Huy Ngo1,
  • Minh-Quang Vu1,
  • Thu-Uyen Nguyen3,
  • Khanh-Toan Phan3,
  • Minh-Quang Do3,
  • Xuan-Tung Dinh3,
  • Van-Hiep Duong3 &
  • …
  • Van-Thiep Nguyen3 

Scientific Reports , Article number:  (2026) Cite this article

We are providing an unedited version of this manuscript to give early access to its findings. Before final publication, the manuscript will undergo further editing. Please note there may be errors present which affect the content, and all legal disclaimers apply.

Subjects

  • Engineering
  • Materials science
  • Mathematics and computing

Abstract

Automated detection of surface defects on three-dimensional (3D) parts is vital for ensuring product quality and safety in manufacturing. However, three key challenges hinder reliable detection: geometric context ambiguity across complex part shapes, domain mismatch between generic pretrained features and industrial scans (with their unique noise and reflectivity), and the scarcity of diverse defect examples for training. To overcome these issues, we propose a novel single-forward-pass framework for point cloud anomaly detection, comprising three new modules: (1) Spatial Context Aggregation, which grounds each local patch in a set of learned global prototypes via an optimal-transport alignment to resolve context ambiguity; (2) Feature Adaptor, a lightweight two-layer multilayer perceptron (MLP) that fine-tunes self-supervised Point-MAE embeddings to the specific characteristics of industrial scans; and (3) Selective Anomalous Feature Generator, which synthesizes realistic hard negatives by corrupting random subsets of feature tokens, thus mitigating the need for extensive defect labels. An attention-based discriminator trained with patch-wise supervision learns to distinguish these hard negatives from genuine defect-free patterns. At inference, our pipeline delivers dense per-point anomaly scores in a single pass at up to 13.5 frames per second (FPS). On the Real3D-AD benchmark, we observe point-level improvements of 2.8% in area under the receiver operating characteristic curve (AUROC) and 5.7% in area under the precision-recall curve (AUPR), with object-level gains of 3.0% (AUROC) and 3.5% (AUPR). Evaluated on our newly released Industrial3D-AD dataset, which captures realistic sensor noise and reflective materials, we see similar enhancements (2.9%/5.3% point-level, 2.8%/3.3% object-level).

Data availability

The newly collected Industrial3D-AD dataset used and analyzed during the current study are available from the corresponding author on reasonable request. The Real3D-AD dataset is accessible on GitHub at https://github.com/M-3LAB/Real3D-AD.

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Funding

This research received no specific grant from any funding agency in the public, commercial, or not-for-profit sectors.

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Authors and Affiliations

  1. Greenwich Vietnam, FPT University, Hanoi, 10000, Vietnam

    Dinh-Cuong Hoang, Ta Huu Anh Duong, Tuan-Minh Huynh, Duc-Manh Nguyen, Minh-Duc Cao, Duc-Huy Ngo & Minh-Quang Vu

  2. College of Engineering, Shibaura Institute of Technology, Tokyo, 135-8548, Japan

    Phan Xuan Tan

  3. ICT Department, FPT University, Hanoi, 10000, Vietnam

    Anh-Nhat Nguyen, Thu-Uyen Nguyen, Khanh-Toan Phan, Minh-Quang Do, Xuan-Tung Dinh, Van-Hiep Duong & Van-Thiep Nguyen

  4. Faculty of Electrical and Electronic Engineering, School of Engineering, Phenikaa University, Hanoi, 12116, Vietnam

    Minhhuy Le

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Contributions

All authors contributed equally to the conceptualization, formal analysis, investigation, methodology, and writing and editing of the original draft. All authors have read and agreed to the published version of the manuscript.

Corresponding authors

Correspondence to Dinh-Cuong Hoang or Phan Xuan Tan.

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Cite this article

Hoang, DC., Tan, P.X., Nguyen, AN. et al. Efficient industrial point cloud anomaly detection via spatial context aggregation and selective anomalous feature generation. Sci Rep (2026). https://doi.org/10.1038/s41598-026-41255-2

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  • Received: 15 July 2025

  • Accepted: 18 February 2026

  • Published: 24 February 2026

  • DOI: https://doi.org/10.1038/s41598-026-41255-2

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Keywords

  • Industrial anomaly detection
  • Industrial anomaly segmentation
  • Defect detection
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