Fig. 6: Impact on transistor behavior. | npj 2D Materials and Applications

Fig. 6: Impact on transistor behavior.

From: Electrothermal transport induced material reconfiguration and performance degradation of CVD-grown monolayer MoS2 transistors

Fig. 6

Transfer characteristics of unstressed/virgin (VD) and stressed (SD) FETs stressed in a–c LFR and d–f HFR of operation at different temperatures. Degraded OFF state performance, loss of gate control and reduced ON state current are the major implications of HF stress. All devices are measured at VDS = 1 V.

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